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CTAL_TM_001 PDF DEMO:

QUESTION NO: 1
You have been given responsibility for the non-functional testing of a safety-critical monitoring & diagnostics package in the medical area. Which of the following would you least expect to see addressed in the test plan? 1 credit
A. Availability
B. Safety
C. Portability
D. Reliability
Answer: C

QUESTION NO: 2
Since the system is in the medical domain and therefore in the safety critical area, testing needs to be rigorous and evidence is required that the system has been adequately tested. Identify THREE measures that would typically be part of the test approach in this domain and which are not always applicable in other domains! 1 credit
A. High level of documentation
B. Failure Mode and Effect Analysis (FMEA) sessions
C. Traceability to requirements
D. Non-functional testing
E. Master test planning
F. Test design techniques
G. Reviews
Answer: A,B,C

QUESTION NO: 3
A test log is one of the documents that need to be produced in this domain in order to provide evidence of testing. However, the level of detail of test logs can vary. Which of the following is NOT an influencing factor for the level of detail of the test logs being produced? 1 credit
A. Level of test execution automation
B. Test level
C. Regulatory requirements
D. Experience level of testers
Answer: D

QUESTION NO: 4
Consider the typical objectives of testing. Which of the following metrics can be used to measure the effectiveness of the testing process in achieving one of those objectives? 1 credit
A. Average number of days between defect discovery and resolution
B. Percentage of requirements covered
C. Lines of code written per developer per day
D. Percentage of test effort spent on regression testing
Answer: B

QUESTION NO: 5
Considerable attention will be given in this project to defining exit criteria and on reporting back on their status. Which combination of TWO exit criteria from the list would be best to use? 1 credit
I. Total number of defects found
II. Percentage of test cases executed
III. Total test effort planned versus total actual test effort spent
IV. Defect trend (number of defects found per test run over time
A. (i) and (ii)
B. (i) and (iv)
C. (ii) and (iii)
D. (ii) and (iv)
Answer: D

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Updated: May 26, 2022